By Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel
Modern electronics rely on nanoscaled applied sciences that current new demanding situations when it comes to trying out and diagnostics. stories are relatively liable to defects considering the fact that they make the most the know-how limits to get the top density. This ebook is a useful advisor to the checking out and diagnostics of the most recent new release of SRAM, some of the most greatly utilized kinds of reminiscence. Classical tools for trying out reminiscence are designed to deal with the so-called "static faults," yet those try recommendations aren't adequate for faults which are rising within the most up-to-date Very Deep Sub-Micron (VDSM) applied sciences. those new fault types, known as "dynamic faults", aren't coated through classical attempt suggestions and require the devoted try out sequences provided during this book.
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Extra info for Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies
Advanced Test Methods for SRAMs: Effective Solutions for Dynamic Fault Detection in Nanoscaled Technologies by Alberto Bosio,Luigi Dilillo,Patrick Girard,Serge Pravossoudovitch,Arnaud Virazel